9581 search results - page 1835 / 1917 » On Ubiquitous Integrated Computing |
ICCAD
2006
IEEE
15 years 6 months ago
2006
IEEE
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...
ICCAD
2006
IEEE
15 years 6 months ago
2006
IEEE
In order to handle device matching in analog circuits, some pairs of modules are required to be placed symmetrically. This paper addresses this device-level placement problem for ...
ICCAD
2006
IEEE
15 years 6 months ago
2006
IEEE
High power consumption will shorten battery life for handheld devices and cause thermal and reliability problems. One way to lower the dynamic power consumption is to reduce the s...
76
Voted
ICCAD
2002
IEEE
15 years 6 months ago
2002
IEEE
We propose to introduce redundant interconnects for manufacturing yield and reliability improvement. By introducing redundant interconnects, the potential for open faults is reduc...
CVPR
2010
IEEE
15 years 6 months ago
2010
IEEE
Many of the recently popular shape based category recognition methods require stable, connected and labeled edges as input. This paper introduces a novel method to find the most st...