187 search results - page 8 / 38 » On Using Efficient Test Sequences for BIST |
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ICCAD
1994
IEEE
15 years 1 months ago
1994
IEEE
The BIST implementation of a conventionally synthesized controller in most cases requires the integration of an additional register only for test purposes. This leads to some seri...
DSD
2005
IEEE
15 years 3 months ago
2005
IEEE
We describe a new e-learning environment and a runtime platform for educational tools on digital system testing and design for testability. This environment is being developed in ...
ICSE
2005
IEEE-ACM
15 years 9 months ago
2005
IEEE-ACM
As software evolves, impact analysis estimates the potential effects of changes, before or after they are made, by identifying which parts of the software may be affected by such ...
DATE
2008
IEEE
2008
IEEE
State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores
14 years 11 months ago
1 We present a new type of Linear Feedback Shift Registers, State Skip LFSRs. State Skip LFSRs are normal LFSRs with the addition of a small linear circuit, the State Skip circuit,...
DATE
2006
IEEE
15 years 3 months ago
2006
IEEE
1 This paper presents a test scheduling approach for system-onchip production tests with peak-power constraints. An abort-onfirst-fail test approach is assumed, whereby the test is...