Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
Yanti Santoso, Matthew C. Merten, Elizabeth M. Rud...
This paper develops the concept of usefulness in the context of supervised learning. We argue that usefulness can be used to improve the performance of classification rules (as me...
Gholamreza Nakhaeizadeh, Charles Taylor, Carsten L...
In this paper, we investigate the role of a biomedical dataset on the classification accuracy of an algorithm. We quantify the complexity of a biomedical dataset using five complex...
A fast subspace analysis and feature extraction algorithm is proposed which is based on fast Haar transform and integral vector. In rapid object detection and conventional binary ...
Disparity estimation can be used to eliminate redundancy among different views in multi-view video compression to obtain high compression efficiency. However, the problem of high c...
Gangyi Jiang, Mei Yu, Feng Shao, You Yang, Haitao ...