301 search results - page 4 / 61 » On bounding the delay of a critical path |
CODES
2000
IEEE
15 years 1 months ago
2000
IEEE
ÍÒÔÖ Ø Ð Ú ÓÖ Ó Ñ ÑÓÖÝ Ñ × Ø Æ ÙÐØ ØÓ ×Ø Ø ÐÐÝ Ò ÐÝÞ Ø ÛÓÖ×ع × Ô Ö ÓÖÑ Ò Ó Ö Ð¹Ø Ñ ×Ý×Ø Ñ׺ Ì × ÔÖÓ Ð Ñ × Ü ...
81
Voted
ITC
2000
IEEE
15 years 1 months ago
2000
IEEE
Transient Signal Analysis (TSA) is a Go/No-Go device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, a technique based o...
IJITWE
2010
14 years 6 months ago
2010
Departmental workflows within a digital business ecosystem are often executed concurrently and required to share limited number of resources. However, unexpected events from the b...
102
Voted
ANSS
1991
IEEE
15 years 1 months ago
1991
IEEE
The notions of the critical path of events and critical time of an event are key concepts in analyzing the performance of a parallel discrete event simulation. The highest critica...
IOLTS
2005
IEEE
15 years 3 months ago
2005
IEEE
With the aggressive scaling of the CMOS technology parametric variation of the transistor threshold voltage causes significant spread in the circuit delay as well as leakage spect...