36 search results - page 4 / 8 » On generating compact test sequences for synchronous sequent... |
ICCD
1997
IEEE
15 years 1 months ago
1997
IEEE
This paper presents a new approach to the automated generation of an initialization sequence for synchronous sequential circuits. Finding an initialization sequence is a hard task...
DATE
1997
IEEE
15 years 1 months ago
1997
IEEE
A new method for state justi cation is proposed for sequential circuit test generation. The linear list of states dynamically obtained during the derivation of test vectors is use...
ICCD
2003
IEEE
15 years 6 months ago
2003
IEEE
We discuss the compaction of independent test sequences for sequential circuits. Our first contribution is the formulation of this problem as an integer program, which we then so...
ICCAD
1998
IEEE
15 years 1 months ago
1998
IEEE
A method is presented for identifying primitive path-delay faults in non-scan sequential circuits and generating robust tests for all robustly testable primitive faults. It uses t...
73
Voted
DATE
1998
IEEE
15 years 1 months ago
1998
IEEE
A new approach for sequential circuit test generation is proposed that combines software testing based techniques at the high level with test enhancement techniques at the gate le...