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» On multi-avoidance of generalized patterns
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78
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DATE
2006
IEEE
66views Hardware» more  DATE 2006»
15 years 6 months ago
On test conditions for the detection of open defects
The impact of test conditions on the detectability of open defects is investigated. We performed an inductive fault analysis on representative standard gates. The simulation resul...
Bram Kruseman, Manuel Heiligers
87
Voted
DATE
2006
IEEE
82views Hardware» more  DATE 2006»
15 years 6 months ago
Concurrent core test for SOC using shared test set and scan chain disable
A concurrent core test approach is proposed to reduce the test cost of SOC. Multiple cores in SOC can be tested simultaneously by using a shared test set and scan chain disable. P...
Gang Zeng, Hideo Ito
91
Voted
GLOBECOM
2006
IEEE
15 years 6 months ago
Multicast Support for a Storage Area Network Switch
— Efficient support of multicast traffic in Storage Area Networks (SANs) enables applications such as remote data replication and distributed multimedia systems, in which a ser...
Andrea Bianco, Paolo Giaccone, Enrico Maria Giraud...
86
Voted
ICALT
2006
IEEE
15 years 6 months ago
Tuning IMS LD for Implementing a Collaborative Lifelong Learning Scenario
This paper describes an approach for modeling and implementing a collaborative learning situation, which is part of a real lifelong learning scenario in astronomy. We adopt and sl...
Davinia Hernández Leo, Eloy D. Villasclaras...
140
Voted
ICPR
2006
IEEE
15 years 6 months ago
Regularized Locality Preserving Learning of Pre-Image Problem in Kernel Principal Component Analysis
In this paper, we address the pre-image problem in kernel principal component analysis (KPCA). The preimage problem finds a pattern as the pre-image of a feature vector defined in...
Weishi Zheng, Jian-Huang Lai