2597 search results - page 177 / 520 » On numbers of Davenport-Schinzel sequences |
104
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CPAIOR
2010
Springer
15 years 6 months ago
2010
Springer
This paper introduces the Increasing Nvalue constraint, which restricts the number of distinct values assigned to a sequence of variables so that each variable in the sequence is l...
109
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ICWE
2010
Springer
15 years 6 months ago
2010
Springer
Due to the availability of huge number of Web services (WSs), finding an appropriate WS according to the requirement of a service consumer is still a challenge. In this paper, we ...
104
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DATE
2000
IEEE
15 years 6 months ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
128
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DATE
1999
IEEE
15 years 6 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
118
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CLOR
2006
15 years 5 months ago
2006
We introduce a stochastic model to characterize the online computational process of an object recognition system based on a hierarchy of classifiers. The model is a graphical netwo...