This paper studies the dynamic bin packing problem, in which items arrive and depart at arbitrary time. We want to pack a sequence of unit fractions items (i.e., items with sizes ...
There are several problem areas that must be addressed when applying randomization to unit testing. As yet no general, fully automated solution that works for all units has been p...
James H. Andrews, Susmita Haldar, Yong Lei, Felix ...
The task of balancing dynamically generated work load occurs in a wide range of parallel and distributed applications. Diffusion based schemes, which belong to the class of nearest...
—Negative Bias Temperature Instability (NBTI) is a significant reliability concern for nanoscale CMOS circuits. Its effects on circuit timing can be especially pronounced for ci...
The task of balancing dynamically generated work load occurs in a wide range of parallel and distributed applications. Diffusion based schemes, which belong to the class of neares...