96 search results - page 14 / 20 » On test coverage of path delay faults |
88
Voted
ET
2000
14 years 9 months ago
2000
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
TCAD
2008
14 years 9 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
DATE
2008
IEEE
15 years 4 months ago
2008
IEEE
— Market and customer demands have continued to push the limits of CMOS performance. At-speed test has become a common method to ensure these high performance chips are being shi...
INFSOF
2007
14 years 9 months ago
2007
: Correct functioning of object-oriented software depends upon the successful integration of classes. While individual classes may function correctly, several new faults can arise ...
DAC
1994
ACM
15 years 1 months ago
1994
ACM
A powerful combinational path sensitization engine is required for the efficient implementation of tools for test pattern generation, timing analysis, and delay fault testing. Path...