96 search results - page 15 / 20 » On test coverage of path delay faults |
89
Voted
VTS
1997
IEEE
15 years 1 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
70
Voted
GLVLSI
2007
IEEE
15 years 3 months ago
2007
IEEE
The path-delay fault simulation of functional tests on complex circuits such as current processor-based systems is a daunting task. The amount of computing power and memory needed...
VTS
2002
IEEE
15 years 2 months ago
2002
IEEE
We present a software-based weighted random pattern scheme for testing delay faults in IP cores of programmable SoCs. We describe a method for determining static and transition pr...
79
Voted
ICSM
2008
IEEE
15 years 3 months ago
2008
IEEE
Test-case prioritization is a typical scenario of regression testing, which plays an important role in software maintenance. With the popularity of Web Services, integrating Web S...
ITC
2003
IEEE
15 years 2 months ago
2003
IEEE
This paper deals with Hybrid multisite testing of VLSI chips by utilizing automatic test equipment (ATE) in connection with built-in self-test (BIST). The performance of a multisi...