96 search results - page 5 / 20 » On test coverage of path delay faults |
VTS
1997
IEEE
15 years 1 months ago
1997
IEEE
Despite all of the advantages that circular BIST ofsers compared to conventional BIST approaches in terms of low area overhead, simple control logic, and easy insertion, it has se...
ASPDAC
2004
ACM
15 years 2 months ago
2004
ACM
- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...
ICCAD
2006
IEEE
15 years 6 months ago
2006
IEEE
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
ICCAD
2008
IEEE
15 years 6 months ago
2008
IEEE
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...
DATE
2005
IEEE
15 years 3 months ago
2005
IEEE
1 The first path implicit and exact non–robust path delay fault grading technique for non–scan sequential circuits is presented. Non enumerative exact coverage is obtained, b...