96 search results - page 7 / 20 » On test coverage of path delay faults |
VTS
1996
IEEE
15 years 1 months ago
1996
IEEE
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
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Voted
EURODAC
1994
IEEE
15 years 1 months ago
1994
IEEE
This paper presents an algorithm for generation of test patterns for strong robust path delay faults, i.e. tests that propagate the fault along a single path and additionally are ...
ICCAD
2002
IEEE
15 years 6 months ago
2002
IEEE
ITC
2000
IEEE
15 years 1 months ago
2000
IEEE
VLSID
1995
IEEE
15 years 1 months ago
1995
IEEE