96 search results - page 8 / 20 » On test coverage of path delay faults |
ASPDAC
2008
ACM
14 years 11 months ago
2008
ACM
ITC
1996
IEEE
15 years 1 months ago
1996
IEEE
This paper describes test generation for delay faults caused by global process disturbances. The structural and spatial correlation between path delays is used to reduce the numbe...
VTS
2007
IEEE
15 years 3 months ago
2007
IEEE
: Conventionally, path delay tests are derived in a delay-independent manner, which causes most faults to be robustly untestable. Many non-robust tests are found but, in practice, ...
78
Voted
TVLSI
2002
14 years 9 months ago
2002
Circular built-in self-test (BIST) is a "test per clock" scheme that offers many advantages compared with conventional BIST approaches in terms of low area overhead, simp...
ASPDAC
2007
ACM
15 years 1 months ago
2007
ACM
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...