This paper presents a procedure for modifying a given set of scan vectors so that the peak power during scan testing is kept below a specified limit without reducing fault coverag...
Power reduction during test application is important from the viewpoint of chip reliability and for obtaining correct test results. One of the ways to reduce scan test power is to...
Mohammed ElShoukry, Mohammad Tehranipoor, C. P. Ra...
— In this investigation we put forth a simple model to quantify the capacity of series elasticity to increase peak power output from an actuator. Using a linear bandwidth limited...
Relaying technique has been developed considerable attention in response to improve reliability and to extend wireless network coverage. One of conventional relaying technique, inc...
A model has been developed to study the global complex dynamics of a series of blackouts in power transmission systems [1, 2]. This model has included a simple level of self-organ...
Benjamin A. Carreras, Vickie E. Lynch, Ian Dobson,...