418 search results - page 32 / 84 » On the Adders with Minimum Tests |
GECCO
2004
Springer
15 years 5 months ago
2004
Springer
This paper gives an algorithm for finding the minimum weight tree having k edges in an edge weighted graph. The algorithm combines a search and optimization technique based on phe...
DFT
2002
IEEE
15 years 4 months ago
2002
IEEE
IDDQ test loses its effectiveness for deep sub-micron chips since it cannot distinguish between faulty and fault-free currents. The concept of current ratios, in which the ratio o...
ICRA
1994
IEEE
15 years 4 months ago
1994
IEEE
In this paper, we are concerned with the problem of location of inspection centers in a multistage manufacturing system. A Genetic algorithm based approach is developed to determi...
DATE
2004
IEEE
15 years 3 months ago
2004
IEEE
This paper presents an overview of an assembler driven verification methodology (ADVM) that was created and implemented for a chip card project at Infineon Technologies AG [2]. Th...
109
click to vote
ICIP
2000
IEEE
16 years 1 months ago
2000
IEEE
New rotationally invariant texture feature extraction methods are introduced that utilise the dual tree complex wavelet transform (DT-CWT). The complex wavelet transform is a new ...