3898 search results - page 345 / 780 » On the Bit Extraction Problem |
124
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DATE
2009
IEEE
15 years 8 months ago
2009
IEEE
Growing test data volume and overtesting caused by excessive scan capture power are two of the major concerns for the industry when testing large integrated circuits. Various test...
134
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CHES
2006
Springer
15 years 7 months ago
2006
Springer
Recent research has shown that cryptographers with glitches are vulnerable in front of Side Channel Attacks (SCA). Since then, several methods, such as Wave Dynamic Differential Lo...
114
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EMSOFT
2006
Springer
15 years 7 months ago
2006
Springer
While hard disk drives are the most common secondary storage devices, their high power consumption and low shockresistance limit them as an ideal mobile storage solution. On the o...
119
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GECCO
2000
Springer
15 years 7 months ago
2000
Springer
In previous work we showed, by Walsh analysis, that summary statistics such as mean, variance, skew, and higher order statistics can be computed in polynomial time for embedded la...
167
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CPM
1995
Springer
15 years 7 months ago
1995
Springer
We consider strings which are succinctly described. The description is in terms of straight-line programs in which the constants are symbols and the only operation is the concaten...