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» On the Bit Extraction Problem
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ISPD
2000
ACM
139views Hardware» more  ISPD 2000»
15 years 9 months ago
Critical area computation for missing material defects in VLSI circuits
We address the problem of computing critical area for missing material defects in a circuit layout. The extraction of critical area is the main computational problem in VLSI yield...
Evanthia Papadopoulou
CVPR
2010
IEEE
15 years 9 months ago
Bayes Optimal Kernel Discriminant Analysis
Kernel methods provide an efficient mechanism to derive nonlinear algorithms. In classification problems as well as in feature extraction, kernel-based approaches map the original...
Di You, Aleix Martinez
ICRA
1999
IEEE
97views Robotics» more  ICRA 1999»
15 years 9 months ago
Clustering of Qualitative Contact States for a Transmission Assembly
Current manufacturing methods for robotic-controlled assembly rely on accurate positioning to ensure task completion, often through the use of special xtures and precise calibrati...
Marjorie Skubic, Benjamin Forrester, Brent Nowak
ICDCS
2010
IEEE
15 years 8 months ago
Visual, Log-Based Causal Tracing for Performance Debugging of MapReduce Systems
Abstract—The distributed nature and large scale of MapReduce programs and systems poses two challenges in using existing profiling and debugging tools to understand MapReduce pr...
Jiaqi Tan, Soila Kavulya, Rajeev Gandhi, Priya Nar...
KDD
2010
ACM
244views Data Mining» more  KDD 2010»
15 years 8 months ago
Connecting the dots between news articles
The process of extracting useful knowledge from large datasets has become one of the most pressing problems in today’s society. The problem spans entire sectors, from scientists...
Dafna Shahaf, Carlos Guestrin