When time is incorporated in the specification of discrete systems, the complexity of verification grows exponentially. When the temporal behavior is specified with symbols, the ve...
This paper presents a comparative analysis of neural networks, simulated annealing, and genetic algorithms in the determination of input patterns for testing analog circuits. The ...
In this paper we prove that the avalanche problem for the Kadanoff sandpile model (KSPM) is P-complete for two-dimensions. Our proof is based on a reduction from the monotone circ...
There have been serious concerns recently about the security of microchips from hardware trojan horse insertion during manufacturing. This issue has been raised recently due to ou...
Francis G. Wolff, Christos A. Papachristou, Swarup...
— Test Pattern Generation for combinational circuits entails the identification of primary input assignments for detecting each fault in a set of target faults. An extension to ...