10718 search results - page 63 / 2144 » On the Circuit Implementation Problem |
VTS
1995
IEEE
15 years 1 months ago
1995
IEEE
To ensure the production of reliable circuits and fully testable unpackaged dies for MCMs burn-in, both dynamic and monitored, remains a feasible option. During this burn-in proce...
CODES
2008
IEEE
15 years 4 months ago
2008
IEEE
Modern embedded compute platforms increasingly contain both microprocessors and field-programmable gate arrays (FPGAs). The FPGAs may implement accelerators or other circuits to s...
DATE
1998
IEEE
15 years 2 months ago
1998
IEEE
We present an integer-linear-programming-based approach for estimating the maximum instantaneous current through the power supply lines for CMOS circuits. It produces the exact so...
ISCAS
2006
IEEE
15 years 3 months ago
2006
IEEE
— This paper presents a novel Ternary More, Less and Equality (MLE) Circuit implemented with Recharged SemiFloating Gate Transistors. The circuit is a ternary application, and te...
DFT
2003
IEEE
15 years 3 months ago
2003
IEEE
Transient faults in VLSI circuits could lead to disastrous consequences. With technology scaling, circuits are becoming increasingly vulnerable to transient faults. This papers pr...