2899 search results - page 429 / 580 » On the Complexity of Exclusion Algorithms for Optimization |
143
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VTS
1995
IEEE
15 years 9 months ago
1995
IEEE
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
159
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WSC
2008
15 years 7 months ago
2008
Modeling and simulation frameworks for use in different application domains, throughout the complete development process, and in different hardware environments need to be highly ...
166
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CVPR
2005
IEEE
15 years 7 months ago
2005
IEEE
We propose an approach to incorporating dynamic models into the human body tracking process that yields full 3– D reconstructions from monocular sequences. We formulate the trac...
119
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EVOW
2008
Springer
15 years 7 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
190
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AIPRF
2008
15 years 6 months ago
2008
A fitness function is needed for a Genetic Algorithm (GA) to work, and it appears natural that the combination of objectives and constraints into a single scalar function using ar...