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81
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EVOW
2008
Springer
15 years 2 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
110
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CCCG
2010
15 years 2 months ago
2010
In this paper, we enumerate the number of combinatorial changes of the the Euclidean minimum spanning tree (EMST) of a set of n moving points in 2dimensional space. We assume that...
112
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CCCG
2007
15 years 2 months ago
2007
We present a heuristic algorithm to compute approximate geodesic distances on a triangular manifold S containing n vertices with partially missing data. The proposed method comput...
120
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DAGSTUHL
2007
15 years 2 months ago
2007
Abstract. In this paper, we consider two particular problems of directed graph matching. The first problem concerns graphs with nodes that have been subdivided into classes of di...
EMNLP
2007
15 years 2 months ago
2007
Deterministic parsing has emerged as an effective alternative for complex parsing algorithms which search the entire search space to get the best probable parse tree. In this pape...