Sciweavers

6 search results - page 2 / 2
» On the Effect of Stuck-at Faults on Delay-insensitive Nanosc...
Sort
View
IOLTS
2009
IEEE
174views Hardware» more  IOLTS 2009»
14 years 27 days ago
ATPG-based grading of strong fault-secureness
—Robust circuit design has become a major concern for nanoscale technologies. As a consequence, for design validation, not only the functionality of a circuit has to be considere...
Marc Hunger, Sybille Hellebrand, Alejandro Czutro,...