Sciweavers

79 search results - page 1 / 16
» On the Relaxation of n-detect Test Sets
Sort
View
DATE
2005
IEEE
99views Hardware» more  DATE 2005»
15 years 3 months ago
Worst-Case and Average-Case Analysis of n-Detection Test Sets
Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform ...
Irith Pomeranz, Sudhakar M. Reddy
DATE
2006
IEEE
89views Hardware» more  DATE 2006»
15 years 3 months ago
Generation of broadside transition fault test sets that detect four-way bridging faults
Generation of n -detection test sets is typically done for a single fault model. In this work we investigate the generation of n -detection test sets by pairing each fault of a ta...
Irith Pomeranz, Sudhakar M. Reddy
ICCD
2003
IEEE
130views Hardware» more  ICCD 2003»
15 years 6 months ago
On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume
This paper presents a pinpoint test set relaxation method for test compression that maximally derives the capability of a run-length encoding technique such as Golomb coding or fr...
Seiji Kajihara, Yasumi Doi, Lei Li, Krishnendu Cha...
VTS
2008
IEEE
81views Hardware» more  VTS 2008»
15 years 3 months ago
On the Relaxation of n-detect Test Sets
Stelios Neophytou, Maria K. Michael
87
Voted
OL
2011
177views Neural Networks» more  OL 2011»
14 years 9 days ago
Exploiting vector space properties to strengthen the relaxation of bilinear programs arising in the global optimization of proce
In this paper we present a methodology for finding tight convex relaxations for a special set of quadratic constraints given by bilinear and linear terms that frequently arise in ...
Juan P. Ruiz, Ignacio E. Grossmann