- For sub-90nm technology nodes and below, random fluctuations of within-die physical process properties are also known as random on-chip variation (OCV). It impacts on the VLSI/So...
Jun-Fu Huang, Victor C. Y. Chang, Sally Liu, Kelvi...
The ability to control the variations in IC fabrication process is rapidly diminishing as feature sizes continue towards the sub-100 nm regime. As a result, there is an increasing...
Sreeja Raj, Sarma B. K. Vrudhula, Janet Meiling Wa...
In this work, we present a general method for approximating nonlinear transformations of Gaussian mixture random variables. It is based on transforming the individual Gaussians wi...
In the universal DNA chip method, target RNAs are mapped onto a set of DNA tags. Parallel hybridization of these tags with an indexed, complementary antitag array then provides an ...
John A. Rose, Russell J. Deaton, Masami Hagiya, Ak...
—Most publications on the capacity and performance of wireless ad hoc networks share the underlying assumption of a uniform random distribution of nodes. In this paper, we study ...