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» On the Simulation of Tikhonov Random Processes
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ASPDAC
2007
ACM
133views Hardware» more  ASPDAC 2007»
15 years 1 months ago
Modeling Sub-90nm On-Chip Variation Using Monte Carlo Method for DFM
- For sub-90nm technology nodes and below, random fluctuations of within-die physical process properties are also known as random on-chip variation (OCV). It impacts on the VLSI/So...
Jun-Fu Huang, Victor C. Y. Chang, Sally Liu, Kelvi...
DAC
2004
ACM
15 years 1 months ago
A methodology to improve timing yield in the presence of process variations
The ability to control the variations in IC fabrication process is rapidly diminishing as feature sizes continue towards the sub-100 nm regime. As a result, there is an increasing...
Sreeja Raj, Sarma B. K. Vrudhula, Janet Meiling Wa...
ICASSP
2010
IEEE
14 years 10 months ago
An adaptive level of detail approach to nonlinear estimation
In this work, we present a general method for approximating nonlinear transformations of Gaussian mixture random variables. It is based on transforming the individual Gaussians wi...
Friedrich Faubel, Dietrich Klakow
DNA
2001
Springer
15 years 2 months ago
The Fidelity of the Tag-Antitag System
In the universal DNA chip method, target RNAs are mapped onto a set of DNA tags. Parallel hybridization of these tags with an indexed, complementary antitag array then provides an ...
John A. Rose, Russell J. Deaton, Masami Hagiya, Ak...
PIMRC
2008
IEEE
15 years 4 months ago
Effects of topology on local throughput-capacity of ad hoc networks
—Most publications on the capacity and performance of wireless ad hoc networks share the underlying assumption of a uniform random distribution of nodes. In this paper, we study ...
Jakob Hoydis, Marina Petrova, Petri Mähö...