The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
Udo Sobe, Karl-Heinz Rooch, Andreas Ripp, Michael ...
—To understand how node mobility and Byzantine node failures affect connectivity of wireless multi-hop networks, this paper investigates resilience of geometric random graphs to ...
— Within-subject analysis in event-related functional Magnetic Resonance Imaging (fMRI) first relies on (i) a detection step to localize which parts of the brain are activated b...
The modeling and analysis of large networks of autonomous agents is an important topic with applications in many different disciplines. One way of modeling the development of such...
— We propose a new scheme for content distribution of large files that is based on network coding. With network coding, each node of the distribution network is able to generate...