In recent literature it has been reported that Dynamic Power Management (DPM) may lead to decreased reliability in real-time embedded systems. The ever-shrinking device sizes cont...
Ranjani Sridharan, Nikhil Gupta, Rabi N. Mahapatra
In this paper we address the the growing issue of junction tunneling leakage (Ijunc) at the circuit level. Specifically, we develop a fast approach to analyze the state-dependent ...
We present a framework for rapidly exploring the design space of low power application-specific programmable processors (ASPP), in particular mediaprocessors. We focus on a catego...
Johnson Kin, Chunho Lee, William H. Mangione-Smith...
- The large magnitude of supply/ground bounces, which arise from power mode transitions in power gating structures, may cause spurious transitions in a circuit. This can result in ...
Power Gating is effective for reducing leakage power. Previously, a Distributed Sleep Transistor Network (DSTN) was proposed to reduce the sleep transistor area by connecting all ...