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WSC
2008
15 years 4 months ago
Simulation analysis of cluster tool operations in wafer fabrication
Cluster tools have been one of the proposed alternatives to improve operations performance in semiconductor fabrication. The benefits include high yield throughput, less contamina...
Amit Kumar Gupta, Peter Lendermann, Appa Iyer Siva...
TCAD
2010
106views more  TCAD 2010»
15 years 10 days ago
Modeling the Overshooting Effect for CMOS Inverter Delay Analysis in Nanometer Technologies
—With the scaling of complementary metal–oxide– semiconductor (CMOS) technology into the nanometer regime, the overshooting effect due to the input-to-output coupling capacit...
Zhangcai Huang, Atsushi Kurokawa, Masanori Hashimo...
ISSRE
2010
IEEE
15 years 12 days ago
Calibrating Probabilistic GUI Testing Models Based on Experiments and Survival Analysis
—Models abstract reality. Although abstract, such models can capture the essence of real world phenomena as long as they are sufficiently accurate. The development of new techni...
Cristiano Bertolini, Alexandre Mota, Eduardo Aranh...
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JCS
2002
94views more  JCS 2002»
15 years 1 months ago
Model-Based Analysis of Configuration Vulnerabilities
Vulnerability analysis is concerned with the problem of identifying weaknesses in computer systems that can be exploited to compromise their security. In this paper we describe a ...
C. R. Ramakrishnan, R. C. Sekar
TSMC
2008
86views more  TSMC 2008»
15 years 1 months ago
Object Worlds in Work Domain Analysis: A Model of Naval Damage Control
Abstract--This paper presents a work domain analysis of damage control on the Canadian Halifax Class frigate. Our analysis made use of the modeling construct of object worlds to he...
G. L. Torenvliet, G. A. Jamieson, R. Chow