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DAC
2006
ACM
15 years 11 months ago
Standard cell characterization considering lithography induced variations
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
Ke Cao, Sorin Dobre, Jiang Hu
DAC
2006
ACM
15 years 11 months ago
Efficient simulation of critical synchronous dataflow graphs
Simulation and verification using electronic design automation (EDA) tools are key steps in the design process for communication and signal processing systems. The synchronous dat...
Chia-Jui Hsu, José Luis Pino, Ming-Yung Ko,...
SIGSOFT
2008
ACM
15 years 10 months ago
Semi-automating small-scale source code reuse via structural correspondence
Developers perform small-scale reuse tasks to save time and to increase the quality of their code, but due to their small scale, the costs of such tasks can quickly outweigh their...
Rylan Cottrell, Robert J. Walker, Jörg Denzin...
SIGSOFT
2007
ACM
15 years 10 months ago
Reconciling software configuration management and product data management
Product Data Management (PDM) and Software Configuration Management (SCM) are the disciplines of building and controlling the evolution of a complex artifacts; either physical or ...
Germán Vega, Jacky Estublier
SIGSOFT
2007
ACM
15 years 10 months ago
Measuring empirical computational complexity
The standard language for describing the asymptotic behavior of algorithms is theoretical computational complexity. We propose a method for describing the asymptotic behavior of p...
Simon Goldsmith, Alex Aiken, Daniel Shawcross Wilk...
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