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DAC
2007
ACM
16 years 21 days ago
Modeling and Estimation of Full-Chip Leakage Current Considering Within-Die Correlation
We present an efficient technique for finding the mean and variance of the full-chip leakage of a candidate design, while considering logic-structures and both die-to-die and with...
Khaled R. Heloue, Navid Azizi, Farid N. Najm
DAC
2004
ACM
16 years 20 days ago
STAC: statistical timing analysis with correlation
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
Jiayong Le, Xin Li, Lawrence T. Pileggi
ICC
2009
IEEE
127views Communications» more  ICC 2009»
15 years 6 months ago
Wireless Location Privacy Protection in Vehicular Ad-Hoc Networks
Abstract—Advances in mobile networks and positioning technologies have made location information a valuable asset in vehicular ad-hoc networks (VANETs). However, the availability...
Joo-Han Song, Vincent W. S. Wong, Victor C. M. Leu...
ICASSP
2008
IEEE
15 years 6 months ago
Impact of mismatched statistics on correlated MIMO capacity
Many recent works that study the impact of spatial correlation on the performance of multi-input multi-output (MIMO) systems assume a separable (also known as the Kronecker) model...
Vasanthan Raghavan, Akbar M. Sayeed, Jayesh H. Kot...
ISPW
2008
IEEE
15 years 6 months ago
Accurate Estimates without Calibration?
Most process models calibrate their internal settings using historical data. Collecting this data is expensive, tedious, and often an incomplete process. Is it possible to make acc...
Tim Menzies, Oussama El-Rawas, Barry W. Boehm, Ray...