We present an efficient technique for finding the mean and variance of the full-chip leakage of a candidate design, while considering logic-structures and both die-to-die and with...
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
Abstract—Advances in mobile networks and positioning technologies have made location information a valuable asset in vehicular ad-hoc networks (VANETs). However, the availability...
Joo-Han Song, Vincent W. S. Wong, Victor C. M. Leu...
Many recent works that study the impact of spatial correlation on the performance of multi-input multi-output (MIMO) systems assume a separable (also known as the Kronecker) model...
Vasanthan Raghavan, Akbar M. Sayeed, Jayesh H. Kot...
Most process models calibrate their internal settings using historical data. Collecting this data is expensive, tedious, and often an incomplete process. Is it possible to make acc...
Tim Menzies, Oussama El-Rawas, Barry W. Boehm, Ray...