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DT
1998
14 years 9 months ago
1998
92
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VLSID
2001
IEEE
15 years 10 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
INTEGRATION
1998
14 years 9 months ago
1998
An increasing part of microelectronic systems is implemented on the basis of predesigned and preverified modules, so-called cores, which are reused in many instances. Core-provide...
ICCD
2002
IEEE
15 years 6 months ago
2002
IEEE
Fault-tolerant distributed real-time systems are presently facing a lot of new challenges. Although many techniques provide effective masking of node failures on the architectural...
115
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CSREAESA
2010
14 years 7 months ago
2010
The primary goal of Built-In Self-Test (BIST) for Field Programmable Gate Arrays (FPGAs) is to completely test all programmable logic and routing resources in the device such that ...