67 search results - page 12 / 14 » Online circuit reliability monitoring |
NIPS
1997
15 years 1 months ago
1997
With the rapid expansion of computer networks during the past few years, security has become a crucial issue for modern computer systems. A good way to detect illegitimate use is ...
JCP
2006
14 years 11 months ago
2006
Abstract-- In this paper a novel pulse sequence testing methodology is presented [22] as an alternative to Time Domain Reflectometry (TDR) for transmission line health condition mo...
102
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ISLPED
2004
ACM
15 years 5 months ago
2004
ACM
We present a novel temperature/leakage sensor, developed for high-speed, low-power, monitoring of processors and complex VLSI chips. The innovative idea is the use of 4T SRAM cell...
148
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ICISC
2009
14 years 9 months ago
2009
Abstract. Automatic recognition of human faces is becoming increasingly popular in civilian and law enforcement applications that require reliable recognition of humans. However, t...
119
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HPCA
2006
IEEE
16 years 2 days ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...