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VLSI
2005
Springer
15 years 8 months ago
Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
1 The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automa...
Erik Larsson, Stina Edbom
ECAI
2004
Springer
15 years 8 months ago
Diagnosis as Semiring-Based Constraint Optimization
Martin Sachenbacher, Brian C. Williams