105 search results - page 2 / 21 » Opportunistic Transient-Fault Detection |
APCSAC
2005
IEEE
15 years 3 months ago
2005
IEEE
Increasing microprocessor vulnerability to soft errors induced by neutron and alpha particle strikes prevents aggressive scaling and integration of transistors in future technologi...
82
Voted
WDAG
1998
Springer
15 years 1 months ago
1998
Springer
We present fault detectors for transient faults, (i.e. corruptions of the memory of the processors, but not of the code of the processors). We distinguish fault detectors for tasks...
98
Voted
DSD
2010
IEEE
14 years 7 months ago
2010
IEEE
Abstract--Recent technology trends have made radiationinduced soft errors a growing threat to the reliability of microprocessors, a problem previously only known to the aerospace i...
DATE
2007
IEEE
15 years 3 months ago
2007
IEEE
Future microprocessors will be highly susceptible to transient errors as the sizes of transistors decrease due to CMOS scaling. Prior techniques advocated full scale structural or...
ISCA
2002
IEEE
15 years 2 months ago
2002
IEEE
We propose a scheme for transient-fault recovery called Simultaneously and Redundantly Threaded processors with Recovery (SRTR) that enhances a previously proposed scheme for tran...