105 search results - page 7 / 21 » Opportunistic Transient-Fault Detection |
ISCA
2010
IEEE
15 years 1 months ago
2010
IEEE
As leakage and other charge storage limitations begin to impair the scalability of DRAM, non-volatile resistive memories are being developed as a potential replacement. Unfortunat...
DSN
2002
IEEE
15 years 2 months ago
2002
IEEE
This paper presents an experimental evaluation of a brake-by-wire application that tolerates transient faults by temporal error masking. A specially designed real-time kernel that...
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Voted
CHES
2004
Springer
15 years 2 months ago
2004
Springer
Because of the rapidly shrinking dimensions in VLSI, transient and permanent faults arise and will continue to occur in the near future in increasing numbers. Since cryptographic c...
DFT
1997
IEEE
15 years 1 months ago
1997
IEEE
Abstract— Error control is a major concern in many computer systems, particularly those deployed in critical applications. Experience shows that most malfunctions during system o...
IEEEPACT
2007
IEEE
15 years 3 months ago
2007
IEEE
Continued scaling of CMOS technology to smaller transistor sizes makes modern processors more susceptible to both transient and permanent hardware faults. Circuitlevel techniques ...