426 search results - page 67 / 86 » Optgen: A Generator for Local Optimizations |
DAC
2010
ACM
15 years 1 months ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
FLAIRS
2008
15 years 2 days ago
2008
Preferences in constraint problems are common but significant in many real world applications. In this paper, we extend our conditional and composite CSP (CCCSP) framework, managi...
DAC
2005
ACM
14 years 11 months ago
2005
ACM
Minimizing power consumption is one of the most important objectives in IC design. Resizing gates and assigning different Vt’s are common ways to meet power and timing budgets. ...
105
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ALT
2008
Springer
14 years 11 months ago
2008
Springer
Abstract. We consider the problem of sequence prediction in a probabilistic setting. Let there be given a class C of stochastic processes (probability measures on the set of one-wa...
102
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ICDM
2007
IEEE
14 years 11 months ago
2007
IEEE
An easily implementable mixed-integer algorithm is proposed that generates a nonlinear kernel support vector machine (SVM) classifier with reduced input space features. A single ...