—The problem of reconstructing the duplication history of a set of tandemly repeated sequences was first introduced by Fitch [4]. Many recent studies deal with this problem, show...
An early-life reliability model is presented that allows wafer test information to be used to predict not only the total number of burn-in failures that occur for a given product,...
This paper presents a system to automatically generate compact explosion diagrams. Inspired by handmade illustrations, our approach reduces the complexity of an explosion diagram ...
Markus Tatzgern, Denis Kalkofen, Dieter Schmalstie...
As FPGA devices become larger, more coarse-grain modules coupled with large scale reconfigurable fabric become available, thus enabling new classes of applications to run effici...
Many documents such as Web documents or XML files have tree structures. A term tree is an unordered tree pattern consisting of internal variables and tree structures. In order to ...