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DFT
2004
IEEE
94views VLSI» more  DFT 2004»
15 years 6 months ago
Response Compaction for Test Time and Test Pins Reduction Based on Advanced Convolutional Codes
This paper addresses the problem of test response compaction. In order to maximize compaction ratio, a single-output encoder based on check matrix of a (n, n1, m, 3) convolutional...
Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman ...
SIGSOFT
2010
ACM
15 years 6 days ago
Future of developer testing: building quality in code
Although much progress has been made in software verification, software testing remains by far the most widely used technique for improving software reliability. Among various typ...
Tao Xie, Nikolai Tillmann, Jonathan de Halleux, Wo...
XPU
2004
Springer
15 years 7 months ago
Going Interactive: Combining Ad-Hoc and Regression Testing
Abstract. Different kinds of unit testing activities are used in practice. Organised unit testing (regression testing or test-first activities) are very popular in commercial pract...
Michael Kölling, Andrew Patterson
TASE
2009
IEEE
15 years 9 months ago
Program Repair as Sound Optimization of Broken Programs
Bernd Fischer, Ando Saabas, Tarmo Uustalu