8398 search results - page 136 / 1680 » Optimal Software Testing |
TIT
1998
15 years 2 months ago
1998
—Page’s test is optimal for detecting a permanent change in distribution, in the sense that it minimizes the worst case average delay to detection given an average distance bet...
106
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DSD
2010
IEEE
15 years 14 days ago
2010
IEEE
This paper describes an OMAP-based real-time test bench to find the Pareto frontier of an H.264/SVC decoder within a distortion-energy optimization space. A metric to estimate vide...
131
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ASPDAC
1998
ACM
15 years 6 months ago
1998
ACM
— Test Pattern Generation for combinational circuits entails the identification of primary input assignments for detecting each fault in a set of target faults. An extension to ...
118
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VTS
1996
IEEE
15 years 6 months ago
1996
IEEE
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
DATE
2008
IEEE
15 years 9 months ago
2008
IEEE
— In the face of increased process variations, at-speed manufacturing test is necessary to detect subtle delay defects. This procedure necessarily tests chips at a slightly highe...