: Soft faults in DRAMs are faults that do not get sensitized directly after an operation is performed, but require a time to pass before the fault can be detected. Tests developed ...
— Accurate generation of circuit specifications from test signatures is a difficult problem, since analytical expressions cannot precisely describe the nonlinear relationships ...
Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun,...
Core-based system-on-chips (SoCs) fabricated on threedimensional (3D) technology are emerging for better integration capabilities. Effective test architecture design and optimizat...
— Many real-world problems demand a feasible solution to satisfy physical equilibrium, stability, or certain properties which require an additional lower level optimization probl...
We present a novel technique called comparison checking that helps optimizer writers debug optimizers by testing, for given inputs, that the semantics of a program are not changed...