We use Kleene algebra with tests to verify a wide assortment of common compiler optimizations, including dead code elimination, common subexpression elimination, copy propagation,...
Power reduction during test application is important from the viewpoint of chip reliability and for obtaining correct test results. One of the ways to reduce scan test power is to...
Mohammed ElShoukry, Mohammad Tehranipoor, C. P. Ra...
A recent result in [13] has demonstrated the existence of a sufficient global EDF schedulability test for sporadic task systems that makes the following guarantee: any task system...
Sanjoy K. Baruah, Vincenzo Bonifaci, Alberto March...
The classical group testing problem asks to determine at most d defective elements in a set of n elements, by queries to subsets that return Yes if the subset contains some defecti...
In this paper, we present an innovative methodology to estimate and improve the quality of analog and mixed-signal circuit testing. We first detect and reduce the redundancy in th...
Carlo Guardiani, Patrick McNamara, Lidia Daldoss, ...