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» Optimal Zero-Aliasing Space Compaction of Test Responses
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ICCAD
2003
IEEE
151views Hardware» more  ICCAD 2003»
13 years 11 months ago
On Compacting Test Response Data Containing Unknown Values
The design of a test response compactor called a Block Compactor is given. Block Compactors belong to a new class of compactors called Finite Memory Compactors. Different from spa...
Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Janu...
DATE
2009
IEEE
134views Hardware» more  DATE 2009»
14 years 1 months ago
A diagnosis algorithm for extreme space compaction
— During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including builti...
Stefan Holst, Hans-Joachim Wunderlich
VTS
2003
IEEE
104views Hardware» more  VTS 2003»
13 years 11 months ago
Application of Saluja-Karpovsky Compactors to Test Responses with Many Unknowns
This paper addresses the problem of compacting test responses in the presence of unknowns at the input of the compactor by exploiting the capabilities of well-known error detectio...
Janak H. Patel, Steven S. Lumetta, Sudhakar M. Red...
DFT
2004
IEEE
94views VLSI» more  DFT 2004»
13 years 10 months ago
Response Compaction for Test Time and Test Pins Reduction Based on Advanced Convolutional Codes
This paper addresses the problem of test response compaction. In order to maximize compaction ratio, a single-output encoder based on check matrix of a (n, n1, m, 3) convolutional...
Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman ...
SAC
2006
ACM
14 years 8 days ago
Induction of compact decision trees for personalized recommendation
We propose a method for induction of compact optimal recommendation policies based on discovery of frequent itemsets in a purchase database, followed by the application of standar...
Daniel Nikovski, Veselin Kulev