The design of a test response compactor called a Block Compactor is given. Block Compactors belong to a new class of compactors called Finite Memory Compactors. Different from spa...
Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Janu...
— During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including builti...
This paper addresses the problem of compacting test responses in the presence of unknowns at the input of the compactor by exploiting the capabilities of well-known error detectio...
Janak H. Patel, Steven S. Lumetta, Sudhakar M. Red...
This paper addresses the problem of test response compaction. In order to maximize compaction ratio, a single-output encoder based on check matrix of a (n, n1, m, 3) convolutional...
We propose a method for induction of compact optimal recommendation policies based on discovery of frequent itemsets in a purchase database, followed by the application of standar...