7303 search results - page 1180 / 1461 » Optimality for dynamic patterns |
131
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FSTTCS
2000
Springer
15 years 7 months ago
2000
Springer
In this paper we investigate some properties and algorithms related to a text sparsification technique based on the identification of local maxima in the given string. As the numb...
153
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HIPC
2000
Springer
15 years 7 months ago
2000
Springer
Embedded systems consisting of the application program ROM, RAM, the embedded processor core and any custom hardware on a single wafer are becoming increasingly common in areas suc...
141
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ICES
2000
Springer
15 years 7 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
128
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SIGGRAPH
1987
ACM
15 years 7 months ago
1987
ACM
Ray tracing produces point samples of an image from a 3-D model. Constructing an antialiased digital picture from point samples is difficult without resorting to extremely high sa...
145
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DAC
2010
ACM
15 years 7 months ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...