7303 search results - page 48 / 1461 » Optimality for dynamic patterns |
IWCC
1999
IEEE
15 years 2 months ago
1999
IEEE
In this paper, we present techniques and algorithms to improve the performance of various communication patterns on message-passing platforms where, for reasons of safety, user-le...
TCAD
2008
14 years 9 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
CASCON
2006
14 years 11 months ago
2006
This research studies the characteristics of field usage patterns in the SpecJVM98 benchmarks. It finds that multiple object instances of the same class often exhibit different fi...
PLDI
1998
ACM
15 years 2 months ago
1998
ACM
Existing array region representation techniques are sensitive to the complexity of array subscripts. In general, these techniques are very accurate and efficient for simple subscr...
ASPDAC
2009
ACM
15 years 4 months ago
2009
ACM
Abstract— Double patterning lithography (DPL) is in current production for memory products, and is widely viewed as inevitable for logic products at the 32nm node. DPL decomposes...