9 search results - page 2 / 2 » Optimized self-tuning for circuit aging |
ISQED
2010
IEEE
14 years 1 months ago
2010
IEEE
With the CMOS transistors being scaled to sub 45nm and lower, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging pr...
DATE
2009
IEEE
14 years 1 months ago
2009
IEEE
Abstract—Reliable and verifiable hardware, software and content usage metering (HSCM) are of primary importance for wide segments of e-commerce including intellectual property a...
ICVS
2001
Springer
13 years 10 months ago
2001
Springer
Abstract. At the first ICVS, we presented SA-C (“sassy”), a singleassignment variant of the C programming language designed to exploit both coarse-grain and fine-grain parallel...
DATE
2009
IEEE
14 years 1 months ago
2009
IEEE
Negative Bias Temperature Instability (NBTI), a PMOS aging phenomenon causing significant loss on circuit performance and lifetime, has become a critical challenge for temporal re...