This paper presents a new approach for on-chip test pattern generation. The set of test patterns generated by a pseudo-random pattern generator (e.g., an LFSR) is transformed into...
—A problem in technology mapping is that the quality of the final implementation depends significantly on the initially provided circuit structure. This problem is critical, es...
Eric Lehman, Yosinori Watanabe, Joel Grodstein, He...
Functional dependency is concerned with rewriting a Boolean function f as a function h over a set of base functions {g1, …, gn}, i.e. f = h(g1, …, gn). It plays an important r...
Chih-Chun Lee, Jie-Hong Roland Jiang, Chung-Yang H...
Multiple description coding (MDC) is source coding for multiple channels such that a decoder which receives an arbitrary subset of the channels may produce a useful reconstruction...
—The distance transform has found many applications in image analysis. Chamfer distance transforms are a class of discrete algorithms that offer a good approximation to the desir...