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ITC
2003
IEEE
129views Hardware» more  ITC 2003»
15 years 3 months ago
Relating Yield Models to Burn-In Fall-Out in Time
An early-life reliability model is presented that allows wafer test information to be used to predict not only the total number of burn-in failures that occur for a given product,...
Thomas S. Barnett, Adit D. Singh
EDBT
2010
ACM
141views Database» more  EDBT 2010»
15 years 3 months ago
Adaptive join processing in pipelined plans
In adaptive query processing, the way in which a query is evaluated is changed in the light of feedback obtained from the environment during query evaluation. Such feedback may, f...
Kwanchai Eurviriyanukul, Norman W. Paton, Alvaro A...
ECAI
2010
Springer
14 years 11 months ago
Bayesian Monte Carlo for the Global Optimization of Expensive Functions
In the last decades enormous advances have been made possible for modelling complex (physical) systems by mathematical equations and computer algorithms. To deal with very long run...
Perry Groot, Adriana Birlutiu, Tom Heskes
FSE
2006
Springer
116views Cryptology» more  FSE 2006»
15 years 2 months ago
On Feistel Structures Using a Diffusion Switching Mechanism
We study a recently proposed design approach of Feistel structure which employs diffusion matrices in a switching way. At ASIACRYPT 2004, Shirai and Preneel have proved that large ...
Taizo Shirai, Kyoji Shibutani
TCSV
2008
128views more  TCSV 2008»
14 years 10 months ago
Redundant Slice Optimal Allocation for H.264 Multiple Description Coding
In this paper a novel H.264 multiple description technique is proposed. The coding approach is based on the redundant slice representation option, defined in the H.264 standard. In...
Tammam Tillo, Marco Grangetto, Gabriella Olmo