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VTS
1997
IEEE
86views Hardware» more  VTS 1997»
15 years 1 months ago
Methods to reduce test application time for accumulator-based self-test
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
Albrecht P. Stroele, Frank Mayer
PVLDB
2008
98views more  PVLDB 2008»
14 years 9 months ago
Performance profiling with EndoScope, an acquisitional software monitoring framework
We propose EndoScope, a software monitoring framework that allows users to pose declarative queries that monitor the state and performance of running programs. Unlike most existin...
Alvin Cheung, Samuel Madden
MICRO
2000
IEEE
133views Hardware» more  MICRO 2000»
15 years 2 months ago
Compiler controlled value prediction using branch predictor based confidence
Value prediction breaks data dependencies in a program thereby creating instruction level parallelism that can increase program performance. Hardware based value prediction techni...
Eric Larson, Todd M. Austin
DAC
2009
ACM
15 years 10 months ago
Handling complexities in modern large-scale mixed-size placement
In this paper, we propose an effective algorithm flow to handle largescale mixed-size placement. The basic idea is to use floorplanning to guide the placement of objects at the gl...
Jackey Z. Yan, Natarajan Viswanathan, Chris Chu
ICCAD
1999
IEEE
148views Hardware» more  ICCAD 1999»
15 years 1 months ago
SAT based ATPG using fast justification and propagation in the implication graph
In this paper we present new methods for fast justification and propagation in the implication graph (IG) which is the core data structure of our SAT based implication engine. As ...
Paul Tafertshofer, Andreas Ganz