We propose in this paper an extension on the Scan Chain Concealment technique to further reduce test time and volume requirement. The proposed methodology stems from the architect...
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
This paper presents a novel algorithm for computing the relative motion between images from compressed linear measurements. We propose a geometry based correlation model that desc...
In this work, an adaptive image compression algorithm is proposed based on the prediction of AC coefficients in Discrete Cosine Transform (DCT) block during reconstruction of image...
We present a compressed domain scheme that is able to recognize and localize actions in real-time1 . The recognition problem is posed as performing an action video query on a test ...