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DAC
2011
ACM
13 years 11 months ago
Rethinking memory redundancy: optimal bit cell repair for maximum-information storage
SRAM design has been a major challenge for nanoscale manufacturing technology. We propose a new bit cell repair scheme for designing maximum-information memory system (MIMS). Unli...
Xin Li
ASPDAC
2010
ACM
161views Hardware» more  ASPDAC 2010»
14 years 9 months ago
Novel dual-Vth independent-gate FinFET circuits
This paper describes gate work function and oxide thickness tuning to realize novel circuits using dual-Vth independent-gate FinFETs. Dual-Vth FinFETs with independent gates enabl...
Masoud Rostami, Kartik Mohanram
ISCA
2002
IEEE
105views Hardware» more  ISCA 2002»
15 years 4 months ago
Power and Performance Evaluation of Globally Asynchronous Locally Synchronous Processors
Due to shrinking technologies and increasing design sizes, it is becoming more difficult and expensive to distribute a global clock signal with low skew throughout a processor di...
Anoop Iyer, Diana Marculescu
ASPDAC
2009
ACM
159views Hardware» more  ASPDAC 2009»
15 years 4 months ago
Congestion-aware power grid optimization for 3D circuits using MIM and CMOS decoupling capacitors
— In three-dimensional (3D) chips, the amount of supply current per package pin is significantly more than in two-dimensional (2D) designs. Therefore, the power supply noise pro...
Pingqiang Zhou, Karthikk Sridharan, Sachin S. Sapa...
HPCA
2003
IEEE
16 years 7 days ago
Deterministic Clock Gating for Microprocessor Power Reduction
With the scaling of technology and the need for higher performance and more functionality, power dissipation is becoming a major bottleneck for microprocessor designs. Pipeline ba...
Hai Li, Swarup Bhunia, Yiran Chen, T. N. Vijaykuma...