In the pursuit of instruction-level parallelism, significant demands are placed on a processor's instruction delivery mechanism. Delivering the performance necessary to meet ...
Bias temperature instability, hot-carrier injection, and gate-oxide wearout will cause severe lifetime degradation in the performance and the reliability of future CMOS devices. Th...
Erika Gunadi, Abhishek A. Sinkar, Nam Sung Kim, Mi...
A cache oblivious matrix transposition algorithm is implemented and analyzed using simulation and hardware performance counters. Contrary to its name, the cache oblivious matrix tr...
D. Tsifakis, Alistair P. Rendell, Peter E. Strazdi...
In this paper, two tools are presented: an execution driven cache simulator which relates event metrics to a dynamically built-up call-graph, and a graphical front end able to visu...
Josef Weidendorfer, Markus Kowarschik, Carsten Tri...
Transient faults in VLSI circuits could lead to disastrous consequences. With technology scaling, circuits are becoming increasingly vulnerable to transient faults. This papers pr...